Transverse beam profile reconstruction using synchrotron radiation interferometry

摘要

Transverse beam size measurements in new generation of synchrotron light sources is a challenging task due to their characteristic small beam emittances and low couplings. Since the late 1990s, synchrotron radiation interferometry (SRI) has been used in many accelerators to measure the beam size through the analysis of the spatial coherence of the synchrotron light. However, the standard SRI using a double-aperture system provides the beam size projection in a given direction. For this reason, the beam shape is not fully characterized because information about possible transverse beam tilts is not determined. In this report, we describe a technique to fully reconstruct the transverse beam profile based on a rotating double-pinhole mask, together with experimental results obtained at ALBA under different beam couplings. We also discuss how this method allows us to infer ultrasmall beam sizes in case of limitations of the standard SRI.