VCSEL in interferometry: a comparison to edge-emitting diode lasers regarding their applicability in speckle-interferometry

摘要

Speckle-Interferometry(SI)isapowerfultoolforfast,robustandnon-contactmeasurementsofdisplacement,vibration,roughnessorshape.OneofthekeycomponentsinSIisthelightsource.Typicallightsourcesaregaslasers,whichmeetallrequirementslikehighintensity,homogeneousbeamprofile,andhighdegreeofcoherence.Duetolargesize,temperaturecontrolandhighcoststhesetypesoflasercanoftennotbeusedasanilluminationsourceinSI-systems.Nexttostandardedge-emittingdiodelasers,verticalcavitysurfaceemittinglasers(VCSEL)areapromisingalternativelightsourceinSI.nbsp;Inthiswork,standardedge-emittinglasersarecomparedtoVCSELsregardingtheapplicabilityininterferometricapplications.