首页> 外文期刊>Romanian reports in physics >Investigations of pulsed laser deposited TiN thin films for titanium implants
【24h】

Investigations of pulsed laser deposited TiN thin films for titanium implants

机译:用于钛植入物的脉冲激光沉积TiN薄膜的研究

获取原文
           

摘要

TiN thin films were deposited at room temperature on polished Ti samplesby PLD. GIXRD investigations showed that films were crystalline, with grain sizesaround 25 nm. Simulations of XRR curves indicated that the layers were dense andonly slightly rougher than Ti substrates. Nanoindentation results showed that TiNfilms possessed a hardness of 26.8 GPa, much harder than Ti substrate, while scratchand wear tests found that films were adherent and exhibited a low friction coefficientof 0.16. Electrochemical tests performed in SBF indicated that the coated Ti samplesexhibited significantly better behavior against corrosion than bare Ti samples.
机译:通过PLD在室温下将TiN薄膜沉积在抛光的Ti样品上。 GIXRD研究表明,薄膜是结晶的,晶粒尺寸约为25 nm。 XRR曲线的模拟表明,这些层致密并且仅比Ti衬底略粗糙。纳米压痕结果表明,TiN薄膜的硬度为26.8 GPa,比Ti基材坚硬得多,而划痕和磨损试验表明,薄膜具有附着力,摩擦系数仅为0.16。在SBF中进行的电化学测试表明,涂覆的Ti样品的抗腐蚀性能比裸Ti样品好得多。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号