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An efficient and novel FDTD method based performance investigation in high-speed current-mode signaling SWCNT bundle interconnect

机译:基于高效新颖的FDTD方法的高速电流模式信令SWCNT束互连中的性能研究

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摘要

Carbon nanotube (CNT) has emerged as the most extensively researched area in nanoscience and amongst the frontrunners in co-triggering the nanotechnology revolution. Single-wall CNT (SWCNT) bundle is a part of CNT family and has been proposed as the future nano-wires in integrated circuits. The present paper analyzes the performance of SWCNT bundle interconnect with high-speed current-mode signaling (CMS) scheme using efficient finite-difference time-domain (FDTD) method. For the first time, FDTD based method is explored for modeling CMSSWCNT bundle interconnect incorporating practical CMOS driver gate. The CMOS gate is characterized by n th power-law model. The stability of FDTD method is ascertained by Courant condition. The proposed FDTD basedmethod is efficient and can be used for performance analyses of future nano-wire SWCNT bundle as well as conventional copper interconnects. At the same time, this method is applicable for both traditional full-voltage swing voltage-mode signaling (VMS) and remarkable low-voltage swing CMS schemes. The various analyses in the paper reveal that CMS SWCNT bundle interconnect has higher edge over CMS copper interconnect in terms of smaller delay, lesser crosstalk induced delay and noise. The proposed analytical FDTD based method is validated using Tanner-SPICE EDA simulation tool. The maximum error between the FDTD and SPICE for the transient response in CMS SWCNT bundle interconnect for 32 nm technology node is within 3%.
机译:碳纳米管(CNT)已成为纳米科学领域研究最广泛的领域,并且是共同推动纳米技术革命的领先者之一。单壁CNT(SWCNT)束是CNT系列的一部分,已被提出作为集成电路中未来的纳米线。本文使用有效的时域有限差分(FDTD)方法分析了采用高速电流模式信令(CMS)方案的SWCNT束互连的性能。首次探索了基于FDTD的方法来建模结合了实际CMOS驱动器栅极的CMSSWCNT束互连。 CMOS门的特征在于第n个幂律模型。 FDTD方法的稳定性由库仑条件确定。所提出的基于FDTD的方法是有效的,可用于未来纳米线SWCNT束以及常规铜互连的性能分析。同时,该方法适用于传统的全电压摆幅电压模式信令(VMS)和出色的低压摆幅CMS方案。论文中的各种分析表明,相比于CMS铜互连,CMS SWCNT束互连具有更高的边缘,这是因为它具有更小的延迟,更小的串扰感应延迟和噪声。使用Tanner-SPICE EDA仿真工具验证了所提出的基于FDTD的分析方法。对于32 nm技术节点,CMS SWCNT束互连中瞬态响应的FDTD和SPICE之间的最大误差在3%以内。

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