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The Effect of Silver-Plating Time on Silicon Nanowires Arrays Fabricated by Wet Chemical Etching Method

机译:镀银时间对湿法化学刻蚀法制备硅纳米线阵列的影响

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MACE (Metal-Assisted Chemical Etching) approach has drawn a lot of attentions due to its ability to create highly light-absorptive silicon surface. This method can generate numerous cylindrical shape microstructure on the surface of silicon like a forest, which is called “silicon nanowires arrays”. This structure can dramatically suppress both reflection and transmission at the wavelength range from 400 nm to near-infrared 1800 nm by increasing the propagation path of light. In this paper, ordered silicon nanowires arrays with a large area are prepared by wet chemical etching. It is demonstrated that the SiNWs (Silicon nanowires) arrays with different morphologies can be fabricated from monocrystalline silicon of a given orientation by changing silver-plating time. Excellent anti-reflection performance in broadband wavelengths and incident angle is obtained. The fabrication method and potential application of such SiNWs in the field of photoelectric detection have great value and can provide reference for further research in this field.
机译:MACE(金属辅助化学蚀刻)方法由于具有创建高吸光性硅表面的能力而备受关注。这种方法可以在像森林的硅表面上生成许多圆柱状的微观结构,称为“硅纳米线阵列”。通过增加光的传播路径,该结构可以显着抑制波长范围为400 nm至近红外1800 nm的反射和透射。本文通过湿法化学刻蚀制备了大面积有序硅纳米线阵列。结果表明,通过改变镀银时间,可以从具有给定方向的单晶硅制造具有不同形态的SiNW(硅纳米线)阵列。获得了在宽带波长和入射角下出色的抗反射性能。此类SiNW的制备方法和在光电检测领域的潜在应用具有重要的价值,可为该领域的进一步研究提供参考。

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