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首页> 外文期刊>Revista mexicana de fisica >Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry
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Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry

机译:剪切法和电子散斑图干涉法比较面内应变

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In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in-plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated.
机译:在这项工作中,已经实现了一种光学装置,该装置可以使用ESPI或ESPSI来评估在复合样品上引起的面内应变。首先,使用面内ESPI测量位移场,随后使我们能够评估相应的应变场。接下来,我们应用ESPSI来测量平面内表面位移(应变)的导数。比较了通过两种技术(ESPI和ESPSI)获得的实验结果。我们发现,通过ESPSI和ESPI获得的应变场之间的差异大致恒定。由于尽管ESPI允许计算绝对应变值,但通过ESPSI测量的应变相对于必须使用其他方法测量的参考值,因此可以得到此结果。一旦对系统ESPSI进行了校准,就无法再使用ESPI。在ESPSI中获得的应变场通过计算的常数之和进行校正。

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