首页> 外文期刊>Results in Physics >Study of dielectric relaxation and thermally activated a.c. conduction in multicomponent Ge 10?xSe 60Te 30In x (0?≤?x?≤?6) chalcogenide glasses using CBH model
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Study of dielectric relaxation and thermally activated a.c. conduction in multicomponent Ge 10?xSe 60Te 30In x (0?≤?x?≤?6) chalcogenide glasses using CBH model

机译:介电弛豫和热活化交流的研究CBH模型在多组分Ge 10?xSe 60Te 30In x(0?≤?x?≤?6)硫族化物玻璃中的导电

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Amorphous Ge10?xSe60Te30Inx(0?≤?x?≤?6) chalcogenide glasses were prepared by melt quench technique. Surface morphology with the chemical composition of the prepared glass was examined using SEM and EDS analysis respectively. Dielectric properties and a.c. conductivity of the multicomponent Ge10?xSe60Te30Inx(0?≤?x?≤?6) chalcogenide glasses have been examined in the frequency range 100?Hz–1?MHz and temperature range 303–328?K. It was noticed that dielectric constant and dielectric loss decreases with the increase of frequency and increases with the increase of temperatures. Frequency and temperature dependence of dielectric constant was explained by orientational polarization. The variation of dielectric loss with frequency and temperature was explained by conduction loss and theory of single polaron hopping of charge carriers suggested by Elliot and Shimakawa for chalcogenide glasses. The experimental results show that a.c. conductivity follows the power lawωswhere s?
机译:采用熔体淬火技术制备了非晶Ge10·xSe60Te30Inx(0≤≤xx≤6)硫属化物玻璃。分别使用SEM和EDS分析检查具有所制备玻璃的化学组成的表面形态。介电性能和交流电已在100?Hz–1?MHz的频率范围和303–328?K的温度范围内检查了多组分Ge10?xSe60Te30Inx(0?≤?x?≤?6)硫族化物玻璃的电导率。注意到介电常数和介电损耗随频率的增加而降低,随温度的升高而增加。介电常数的频率和温度依赖性通过取向极化来解释。 Elliot和Shimakawa提出的硫族化物玻璃的电导损耗和电荷载子的单极化子跳跃理论解释了介电损耗随频率和温度的变化。实验结果表明电导率遵循幂定律ωs,其中s?<?1且s的值随温度的升高而减小。交流的当前发现用CBH模型可以很好地解释电导率和s随温度的变化。

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