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Software Defect Prediction in Class Level Metric Aggregation Using Data Mining Techniques

机译:使用数据挖掘技术的类级别度量标准聚合中的软件缺陷预测

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Aim of study software defect is a flaw, miscalculation, or failure, in a computer program or framework delivering an inappropriate or surprising result, or making it perform in an unintended way. Software Defect Prediction (SDP) finds defective modules in software. The final product ought to have as few defects as possible to create top notch software. Early software defects discovery prompts diminished development costs and rework effort and better software. Software metrics guarantee quantitative methods to survey software quality. Software metrics are helpful to software process and product metrics. Thus, a defect prediction study is critical to guarantee quality software and software metric aggregation. In this study, the efficiency of classifier for SDP is assessed. Diverse classifiers like Na?ve Bayes, K Nearest Neighbor (KNN), C4.5 and Multilayer Perceptrons Neural Network (MLPNN) are assessed for SDP.
机译:研究软件缺陷的目的是在计算机程序或框架中提供不适当或令人惊讶的结果,或使其以非预期的方式执行时的缺陷,计算错误或失败。软件缺陷预测(SDP)在软件中查找有缺陷的模块。最终产品应该具有尽可能少的缺陷,以创建一流的软件。早期的软件缺陷发现促使开发成本和返工量减少,并且软件质量更高。软件指标可确保采用定量方法来调查软件质量。软件指标有助于软件过程和产品指标。因此,缺陷预测研究对于保证高质量的软件和软件指标聚合至关重要。在这项研究中,对SDP分类器的效率进行了评估。评估了诸如朴素贝叶斯,K最近邻(KNN),C4.5和多层感知器神经网络(MLPNN)的各种分类器的SDP。

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