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Microstructural Investigation of PM-355 Nuclear Track Detector Subjected to Low-Dose Gamma Irradiation: A Positron Annihilation Lifetime Study

机译:小剂量伽马射线辐照对PM-355核径迹探测器的微观结构研究:正电子An灭寿命研究

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Samples of the PM-355 polymeric solid state nuclear track detector were exposed to low gamma absorbed doses from 1 kGy (0.1 Mrad) up to 9 kGy (0.9 Mrad). Positron annihilation lifetime (PAL) in conjunction with transmission electron microscopy (TEM) and Thermo-gravimetric analysis (TGA) were performed on irradiated and pristine samples at room temperature. The observed lifetime spectra were resolved into three components where the ortho-positronium (o-Ps) lifetime component was associated with the pick-off annihilation of positronium trapped by the free volume. PAL studies of irradiated PM-355 samples showed that ortho-positronium (o-Ps) lifetime increases with an increase in dose up to 4 kGy and decreases at higher doses. In contrast, the intensity of the o-Ps component, I3, decreases with the dose up to about 2 kGy, followed by a much smooth decrease up to 7 kGy, and then it levels off. TGA analysis indicated that the PM-355 detector decomposed in one main breakdown stage. These results are discussed on the basis of chemical and physical changes occurring at the microscopic level in the PM-355 due to irradiation. Crosslinking dominates for doses between 1 and 4 kGy, while the degradation mechanism (Chain scission) prevails for doses up to 9 kGy.
机译:将PM-355聚合物固态核径迹探测器的样品暴露于1 kGy(0.1 Mrad)至9 kGy(0.9 Mrad)的低伽玛吸收剂量下。正电子an没寿命(PAL)与透射电子显微镜(TEM)和热重分析(TGA)一起在室温下对辐照和原始样品进行。观察到的寿命谱分解为三个分量,其中正正电子(o-Ps)寿命分量与自由体积捕获的正电子的an灭相关。 PAL对辐照过的PM-355样品的研究表明,正电子ron(o-Ps)的寿命随着剂量的增加而增加,直至4 kGy,而随着剂量的增加而减小。相反,o-Ps组分I3的强度随着剂量增加至大约2 kGy而降低,随后平滑地下降至7 kGy,然后趋于平稳。 TGA分析表明,PM-355检测器在一个主要故障阶段分解。这些结果是基于由于辐照在PM-355中微观水平发生的化学和物理变化而讨论的。交联在1至4 kGy之间占主导地位,而降解机制(断链)在9 kGy以下剂量占主导地位。

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