Characterization of the Proton-irradiated/Oxidized NuclearGraphite by Positron Annihilation Lifetime and XRD Techniques

摘要

The microstructural changes of IG-110 nuclear graphite due to proton irradiation and oxidation were characterized by thepositron annihilation lifetime spectrometer and X-ray diffractometer. Specimens (10×10×1mm3), prepared by polishing up to2000 grit emery paper were irradiated by 3.0MeV protons up to the dose of 3.4×1017ions/cm2 at 80°C and thermally oxidizedat 700°C and 900°C. Results showed that both the positron lifetime spectrometer and the X-ray diffractometer could be viableresearch tools for studying the fine-scale defect structures in nuclear graphites.