首页> 外文期刊>Frontiers in Neuroanatomy >Neuroanatomy from Mesoscopic to Nanoscopic Scales: An Improved Method for the Observation of Semithin Sections by High-Resolution Scanning Electron Microscopy
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Neuroanatomy from Mesoscopic to Nanoscopic Scales: An Improved Method for the Observation of Semithin Sections by High-Resolution Scanning Electron Microscopy

机译:从介观尺度到纳米尺度的神经解剖学:一种通过高分辨率扫描电子显微镜观察半薄切片的改进方法

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Semithin sections are commonly used to examine large areas of tissue with an optical microscope, in order to locate and trim the regions that will later be studied with the electron microscope. Ideally, the observation of semithin sections would be from mesoscopic to nanoscopic scales directly, instead of using light microscopy and then electron microscopy (EM). Here we propose a method that makes it possible to obtain high-resolution scanning EM images of large areas of the brain in the millimeter to nanometer range. Since our method is compatible with light microscopy, it is also feasible to generate hybrid light and electron microscopic maps. Additionally, the same tissue blocks that have been used to obtain semithin sections can later be used, if necessary, for transmission EM, or for focused ion beam milling and scanning electron microscopy (FIB-SEM).
机译:Semithin切片通常用于用光学显微镜检查组织的大面积,以便定位和修整区域,稍后将用电子显微镜进行研究。理想情况下,半薄切片的观察应直接从介观尺度到纳米尺度,而不是先使用光学显微镜再使用电子显微镜(EM)。在这里,我们提出了一种方法,使得有可能获得毫米到纳米范围内大面积大脑的高分辨率扫描EM图像。由于我们的方法与光学显微镜兼容,因此生成混合的光学和电子显微镜图也是可行的。此外,如有必要,稍后可将用于获取半薄切片的相同组织块用于透射EM或聚焦离子束铣削和扫描电子显微镜(FIB-SEM)。

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