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Enhanced Automatic Wavelet Independent Component Analysis for Electroencephalographic Artifact Removal

机译:增强型自动小波独立分量分析,用于脑电图伪影去除

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Electroencephalography (EEG) is a fundamental diagnostic instrument for many neurological disorders, and it is the main tool for the investigation of the cognitive or pathological activity of the brain through the bioelectromagnetic fields that it generates. The correct interpretation of the EEG is misleading, both for clinicians’ visual evaluation and for automated procedures, because of artifacts. As a consequence, artifact rejection in EEG is a key preprocessing step, and the quest for reliable automatic processors has been quickly growing in the last few years. Recently, a promising automatic methodology, known as automatic wavelet-independent component analysis (AWICA), has been proposed. In this paper, a more efficient and sensitive version, called enhanced-AWICA (EAWICA), is proposed, and an extensive performance comparison is carried out by a step of tuning the different parameters that are involved in artifact detection. EAWICA is shown to minimize information loss and to outperform AWICA in artifact removal, both on simulated and real experimental EEG recordings.
机译:脑电图(EEG)是许多神经系统疾病的基本诊断工具,并且是通过其产生的生物电磁场研究大脑的认知或病理活动的主要工具。对EEG的正确解释会由于伪影而对临床医生的视觉评估和自动化程序产生误导。结果,EEG中的伪影剔除是关键的预处理步骤,并且在最近几年中,对可靠的自动处理器的要求一直在迅速增长。最近,提出了一种有前途的自动方法,称为自动小波无关分量分析(AWICA)。在本文中,提出了一种更有效,更敏感的版本,称为增强AWICA(EAWICA),并通过调整伪影检测中涉及的不同参数的步骤来进行广泛的性能比较。在模拟和真实的实验性EEG记录上,EAWICA可以最大程度地减少信息丢失,并且在去除伪影方面优于AWICA。

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