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Electrochemical Formation and Selenization of Ternary CuZnSn Alloys for Growing Cu2ZnSnSe4 Photoactive Thin Films

机译:生长Cu 2 ZnSnSe 4 光敏薄膜的三元CuZnSn合金的电化学形成和硒化

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摘要

A two-step electrochemical route for the synthesis of Cu2ZnSnSe4 (CZTSe) photoactive thin films isreported in this work. A ternary Cu-Zn-Sn (CZT) alloy was electrochemically deposited onto Indiumdoped Tin Oxide (ITO) substrates from citrate electrolyte followed by a thin layer of Se on the top.The CZT + Se deposits were annealed under vacuum and characterized by means of field emissionscanning electron microscopy (FESEM), energy dispersive spectrometry (EDS), X-ray diffraction(XRD), Raman spectroscopy and UV-VIS spectroscopy respectively. The XRD measurementsindicated that when annealed under vacuum at 350 C, the manufactured CZT+ Se precursorscontained the main diffraction peaks of CZTSe in addition to secondary phases such as Cu6Sn5 andCu5Zn8 binaries. With increasing temperature up to 550 C, the CZTSe deposits presented stannitestructure with a band gap of 1.12 eV and contained traces of Cu2SnSe3 phase.
机译:在这项工作中报告了用于合成Cu2ZnSnSe4(CZTSe)光敏薄膜的两步电化学路线。将三元Cu-Zn-Sn(CZT)合金从柠檬酸盐电解液中电化学沉积到铟掺杂的氧化锡(ITO)衬底上,然后在顶部形成一层Se薄层.CZT + Se沉积物在真空下退火,并通过以下方法表征场发射扫描电子显微镜(FESEM),能量色散光谱(EDS),X射线衍射(XRD),拉曼光谱和UV-VIS光谱。 XRD测量表明,当在350℃下真空退火时,除了次级相如Cu 6 Sn 5和Cu 5 Zn 8二元相之外,所制备的CZT + Se前体还包含CZTSe的主要衍射峰。随着温度升高到550°C,CZTSe沉积物呈现出带隙为1.12 eV的锡矿结构,并含有痕量的Cu2SnSe3相。

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