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首页> 外文期刊>IEICE transactions on information and systems >An Approach for Solving SAT/MaxSAT-Encoded Formal Verification Problems on FPGA
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An Approach for Solving SAT/MaxSAT-Encoded Formal Verification Problems on FPGA

机译:在FPGA上解决SAT / MaxSAT编码形式验证问题的方法

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WalkSAT (WSAT) is one of the best performing stochastic local search algorithms for the Boolean Satisfiability (SAT) and the Maximum Boolean Satisfiability (MaxSAT). WSAT is very suitable for hardware acceleration because of its high inherent parallelism. Formal verification of digital circuits is one of the most important applications of SAT and MaxSAT. Structural knowledge such as logic gates and their dependencies can be derived from SAT/MaxSAT instances generated from formal verification of digital circuits. Such that knowledge is useful to solve these instances efficiently. In this paper, we first discuss a heuristic to utilize the structural knowledge for solving these problems by using WSAT. Then, we show its implementation on FPGA. The problem size of the formal verification is typically very large, and most data have to be placed in off-chip DRAMs. In this situation, the acceleration by FPGA is limited by the throughput and access latency of the DRAMs. In our implementation, data are carefully mapped on the on-chip memory banks and off-chip DRAMs so that most data in the off-chip DRAMs can be continuously accessed using burst-read. Furthermore, a variable-way cache memory comprised of the on-chip memory banks is used in order to hide the DRAM access latency by caching the head portion of the continuous read from the DRAMs and giving them to the circuit till the rest portion is started to be given by the burst-read. We evaluate the performance of our proposed method by changing configuration of the variable-way cache and the processing parallelism, and discuss how much acceleration can be achieved.
机译:WalkSAT(WSAT)是针对布尔可满足性(SAT)和最大布尔可满足性(MaxSAT)的性能最佳的随机本地搜索算法之一。 WSAT具有很高的固有并行度,因此非常适合硬件加速。数字电路的形式验证是SAT和MaxSAT的最重要应用之一。诸如逻辑门及其相关性之类的结构知识可以从数字电路的形式验证中生成的SAT / MaxSAT实例中得出。这样的知识对于有效地解决这些情况很有用。在本文中,我们首先讨论一种启发式方法,该方法利用结构知识通过WSAT解决这些问题。然后,我们展示其在FPGA上的实现。形式验证的问题规模通常非常大,并且大多数数据必须放置在片外DRAM中。在这种情况下,FPGA的加速受到DRAM的吞吐量和访问延迟的限制。在我们的实现中,数据被仔细地映射到片上存储体和片外DRAM上,以便可以使用突发读取连续访问片外DRAM中的大多数数据。此外,使用了一个由片上存储库组成的可变方式高速缓存存储器,以便通过缓存从DRAM读取的连续数据的头部并将其提供给电路直到其余部分开始,从而隐藏DRAM访问延迟。由突发读取给出。我们通过更改可变方式缓存的配置和处理并行性来评估我们提出的方法的性能,并讨论可以实现多少加速。

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