HaWL: Hidden Cold Block-Aware Wear Leveling Using Bit-Set Threshold for NAND Flash Memory

摘要

In this letter, we propose a novel wear leveling technique we call Hidden cold block-aware Wear Leveling (HaWL) using a bit-set threshold. HaWL prolongs the lifetime of flash memory devices by using a bit array table in wear leveling. The bit array table saves the histories of block erasures for a period and distinguishes cold blocks from all blocks. In addition, HaWL can reduce the size of the bit array table by using a one-to-many mode, where one bit is related to many blocks. Moreover, to prevent degradation of wear leveling in the one-to-many mode, HaWL uses bit-set threshold (BST) and increases the accuracy of the cold block information. The performance results illustrate that HaWL prolongs the lifetime of flash memory by up to 48% compared with previous wear leveling techniques in our experiments.