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首页> 外文期刊>American Journal of Optics and Photonics >Population Inversion and X-Ray Laser Gain by Electron Impact Excitation of Ni-Like Tin
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Population Inversion and X-Ray Laser Gain by Electron Impact Excitation of Ni-Like Tin

机译:镍锡电子碰撞激发的种群反转和X射线激光增益

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Excitation energies and transition probabilities for the 1s~22s~22p~63s~23p~63d~(10), and the 1s~22s~22p~63s~23p~63d~94l (l= s, p, d, and f) configurations in nickel-like tin have been used to calculate the reduced population of 99 fine structure levels over a wide range of electron densities and at different electron plasma temperatures. The gain coefficients for those transitions with positive population inversion factors have been calculated as a function of electron density. This study is concerned with the transitions which produce positive gain at XUV and X-ray spectral regions.
机译:1s〜22s〜22p〜63s〜23p〜63d〜(10)和1s〜22s〜22p〜63s〜23p〜63d〜94l的激发能和跃迁几率(l = s,p,d和f)镍样锡中的金属构型已用于计算在较宽的电子密度范围和不同电子等离子体温度下减少的99种精细结构能级。具有正的总体反转因子的那些跃迁的增益系数已作为电子密度的函数进行了计算。这项研究与在XUV和X射线光谱区域产生正增益的跃迁有关。

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