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Determination of domain wall chirality using in situ Lorentz transmission electron microscopy

机译:用原位洛伦兹透射电子显微镜测定畴壁手性

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Controlling domain wall chirality is increasingly seen in non-centrosymmetric materials. Mapping chiral magnetic domains requires knowledge about all the vector components of the magnetization, which poses a problem for conventional Lorentz transmission electron microscopy (LTEM) that is only sensitive to magnetic fields perpendicular to the electron beams direction of travel. The standard approach in LTEM for determining the third component of the magnetization is to tilt the sample to some angle and record a second image. This presents a problem for any domain structures that are stabilized by an applied external magnetic field (e.g. skyrmions), because the standard LTEM setup does not allow independent control of the angle of an applied magnetic field, and sample tilt angle. Here we show that applying a modified transport of intensity equation analysis to LTEM images collected during an applied field sweep, we can determine the domain wall chirality of labyrinth domains in a perpendicularly magnetized material, avoiding the need to tilt the sample.
机译:在非中心对称材料中越来越多地看到控制畴壁手性。映射手性磁畴需要有关磁化的所有矢量成分的知识,这对常规的洛伦兹透射电子显微镜(LTEM)构成了一个问题,该技术仅对垂直于电子束传播方向的磁场敏感。 LTEM中用于确定磁化强度第三分量的标准方法是将样品倾斜到某个角度并记录第二张图像。对于通过施加的外部磁场(例如,天窗离子)稳定的任何畴结构,这都是一个问题,因为标准的LTEM设置不允许独立控制施加的磁场的角度和样品倾斜角。在这里,我们表明,对应用的场扫描期间收集的LTEM图像应用强度方程分析的改进的传输方式,我们可以确定垂直磁化材料中迷宫畴的畴壁手性,而无需倾斜样品。

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