首页> 外文期刊>AIP Advances >Signature of structural distortion in optical spectra of YFe2O4 thin film
【24h】

Signature of structural distortion in optical spectra of YFe2O4 thin film

机译:YFe2O4薄膜的光谱结构失真特征

获取原文
           

摘要

We report structural, optical, and electro-optical properties of polycrystalline YFe2O4thin films,deposited on (0001) sapphire substrates using the electron-beam deposition technique. The optical spectra of a 120 nm YFe2O4 show Fe d to d on-site and O 2p to Fe 3d, Y 4d, and Y 5scharge-transfer electronic excitations. Anomalies in the temperature dependence data of the charge-transfer excitations and the splitting of the 4.46 eV charge-transfer peak strongly suggest a structural distortion at 180 ± 10 K. Evidence of such a structural distortion is also manifested in the surface resistance versus temperature data. In addition, the YFe2O4thin film at low temperatures shows strong electro-optical properties, as high as 9% in the energy range of 1 - 2.5 eV, for applied electric fields up to 500 V.cm?1.
机译:我们报告使用电子束沉积技术沉积在(0001)蓝宝石衬底上的多晶YFe2O4薄膜的结构,光学和电光特性。 120 nm YFe2O4的光谱显示,从原位的Fe d到d,从O 2p的Fe到Fe 3d,Y 4d和Y 5s电荷转移电子激发。电荷转移激发的温度依赖性数据的异常以及4.46 eV电荷转移峰的分裂强烈表明在180±10 K时出现结构变形。这种结构变形的证据还表现在表面电阻与温度数据之间。另外,在低温下的YFe 2 O 4薄膜显示出强的电光特性,对于高达500V·cm 2的施加电场,在1-2.5eV的能量范围内高达9%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号