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The Reliability of Circuits in the Basis Anticonjunction with Constant Faults of Gates

机译:带有恒定故障门的基础反合电路的电路可靠性

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We consider the realization of Boolean functions by asymptotically optimal reliable circuits with constant faults at the outputs of the gates in the basis {x|y} (where x|y п??- anticonjunction i.п??. ). It is proved that almost all Boolean functions can be realized by asymptotically optimal reliable circuits that operate with unreliability asymptotically equal to 2ε_(0) +ε_(1) at ε_(0), ε_(1) → 0, where ε_(0) – probability of faults of type 0 at the output of basis gate, ε_(1) – probability of faults of type 1 at the output of basis gate.
机译:我们考虑通过在{x | y}为基础(其中x | yτ??-反结点i.п??。)的情况下在门的输出端具有恒定故障的渐近最优可靠电路来实现布尔函数。证明了几乎所有的布尔函数都可以通过渐近最优可靠电路来实现,该渐近最优可靠电路在ε_(0),ε_(1)→0时渐近等于2ε_(0)+ε_(1),其中ε_(0) –基本门输出处类型0的故障概率ε_(1)–基本门输出处类型1的故障概率。

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