CONDUCTION STUDIES ON EVAPORATED CADMIUM SULPHIDE THIN FILMS

摘要

CdS thin films were prepared by thermal evaporation technique under vacuum onto glass substrates at different substrate temperatures with different gaps. The structure of the films was confirmed using X-ray diffraction (XRD). The deposited films were found to have a crystalline structure with hexagonal phase. The electrical properties were found to depend on the substrate temperatures. A significant increase of resistivity from 103 to 107 Ωm and space-charge-limited current were observed in CdS films evaporated by vacuum evaporation. Ohmic behavior was detected at low voltage, on the other hand the space charge limited current (SCLC) was noticed at high voltage. The transition voltage (Vt) was varied with substrate temperatures and the distance of the gaps.