Absorbance and current-voltage hysteresis curve of silver sulfide thin films synthetized by solid-vapor reactions

摘要

Silver sulfide thin films (Ag 2 S) with thickness ranging from 90 to 290 nm were synthesizedusing a low temperature (110 o C) solid-vapor reaction by sulfurizing(3h) sputtered silver on glass substrates.Samples were characterized by X -Ray diffraction, Field Emission G un Scanning Electron Microscopy and Energy Dispersive X -Ray Spectroscopy. In addition, optical and electrical properties were investigated using an Ultraviolet -Visible Spectrophotometer and a Physical Properties Measurement System.Results showsband gaps in the range of 1.7 to 2.6 eV that are dependent on the film thickness. Electrical propertiesexhibit a hysteresis I-V curve that is characteristic of memory devices and can be attributed to the Ag + ions migration inside the Ag 2 S film forming co nducting filaments.