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首页> 外文期刊>Beilstein Journal of Nanotechnology >Light-induced magnetoresistance in solution-processed planar hybrid devices measured under ambient conditions
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Light-induced magnetoresistance in solution-processed planar hybrid devices measured under ambient conditions

机译:在环境条件下测量的固溶处理平面混合器件中的光致磁阻

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We report light-induced negative organic magnetoresistance (OMAR) measured in ambient atmosphere in solution-processed 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-pentacene) planar hybrid devices with two different device architectures. Hybrid electronic devices with trench-isolated electrodes (HED-TIE) having a channel length of ca. 100 nm fabricated in this work and, for comparison, commercially available pre-structured organic field-effect transistor (OFET) substrates with a channel length of 20 µm were used. The magnitude of the photocurrent as well as the magnetoresistance was found to be higher for the HED-TIE devices because of the much smaller channel length of these devices compared to the OFETs. We attribute the observed light-induced negative magnetoresistance in TIPS-pentacene to the presence of electron–hole pairs under illumination as the magnetoresistive effect scales with the photocurrent. The magnetoresistance effect was found to diminish over time under ambient conditions compared to a freshly prepared sample. We propose that the much faster degradation of the magnetoresistance effect as compared to the photocurrent was due to the incorporation of water molecules in the TIPS-pentacene film.
机译:我们报告光诱导的负有机磁阻(OMAR)在具有两种不同设备架构的溶液处理的6,13-​​双(三异丙基甲硅烷基乙炔基)并五苯(TIPS-并五苯)平面混合设备中在环境大气中测量。带有沟槽隔离电极(HED-TIE)的混合电子设备,其沟道长度约为。在这项工作中制造了100 nm,并且为了进行比较,使用了沟道长度为20 µm的可商购的预构造有机场效应晶体管(OFET)基板。对于HED-TIE器件,发现光电流和磁阻的幅度更高,因为与OFET相比,这些器件的沟道长度小得多。我们将在TIPS-并五苯中观察到的光诱导负磁阻归因于在光照下电子-空穴对的存在,因为磁阻效应与光电流成比例。与新鲜制备的样品相比,发现在环境条件下磁阻效应随时间而减小。我们提出,与光电流相比,磁阻效应的更快退化是由于在TIPS-并五苯薄膜中掺入了水分子。

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