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Focused-ion beam analysis of media defects

机译:聚焦离子束分析介质缺陷

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摘要

Magnetoresistive (MR) and giant magnetoresistive (GMR) heads are uniquely susceptible to defects on the media that give rise to thermal asperities (TA), effects that suddenly heat or cool the read-head element. Such events shift and tilt the baseline of the magnetic readback signal, possibly scrambling the data. With fly heights falling below 1.2 μin, defects as small as 0.4 μin (and diameters less than 1 μm) can cause asperities.
机译:磁阻(MR)和巨磁阻(GMR)磁头特别容易受到介质上缺陷的影响,从而引起热粗糙(TA),这种效应会突然加热或冷却读头元件。这样的事件会使磁回读信号的基线发生偏移和倾斜,从而可能使数据混乱。当飞行高度下降到1.2μin以下时,小至0.4μin(且直径小于1μm)的缺陷会导致粗糙。

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