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Effect of chromium content and sweep rate on passive film growth on iron-chromium alloys studied by EQCM and XPS

机译:EQCM和XPS研究铬含量和扫描速率对铁铬合金钝化膜生长的影响

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摘要

Growth of passive films on Cr and Fe-Cr alloys with Cr concentrations ranging from 15 /100 to 54/100 was studied in situ with the electrochemical quartz crystal microbalance (EQCM). Mass change and current transient s were measured as the response to a potential change in The passive region form 0 to 800 mV(SHE) in a pH 1.5 sulfate electrolyte. From these Measurements, the thickness change as well as integral and differential growth fractions were Calculated. The growth fraction expresses the fraction of oxidized metal that remains in the Film.
机译:利用电化学石英晶体微量天平(EQCM)原位研究了Cr和Fe-Cr合金上Cr浓度在15/100至54/100之间的钝化膜的生长。测量质量变化和电流瞬变s,作为对pH 1.5硫酸盐电解质中0至800 mV(SHE)形成的无源区域中电势变化的响应。从这些测量中,计算出厚度变化以及积分和微分生长分数。生长分数表示残留在膜中的氧化金属的分数。

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