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Elaborate Refresh: A Fine Granularity Retention Management for Deep Submicron DRAMs

机译:精心刷新:针对深亚微米DRAM的精细粒度保留管理

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摘要

As the DRAM cell size continues to shrink, the proportion of leaky cells is increasing. As a result, the prior approaches, called retention aware refresh, which skip unnecessary refresh operations for non-leaky cells, are unable to skip as many refresh operations as before. The large granularity of the DRAM refresh mechanism makes this problem more serious. Specifically, even when there are only a small number of leaky cells in a particular retention group, that group is classified as a leaky group. Because of that, many non-leaky cells that also belong to that group are refreshed at an unnecessarily frequent rate. Since the granularity of the retention group is larger, this inefficiency becomes huge. To solve this problem, we propose a novel retention aware refresh approach called Elaborate Refresh, to reduce the granularity of the retention group further. The key idea of the Elaborate Refresh is to store leaky row addresses per each chip, and refresh different leaky row in each chip simultaneously. By doing so, Elaborate Refresh reduces the overhead of the leaky group refresh 16 times. In addition, Elaborate Refresh stores retention information in the DRAM chip, thus saving the refresh energy, even in the self-refresh mode when the memory controller cannot control the DRAM.
机译:随着DRAM单元尺寸的不断缩小,泄漏单元的比例正在增加。结果,被称为保留感知刷新的现有方法无法跳过非泄漏单元的不必要的刷新操作,因此无法像以前那样跳过尽可能多的刷新操作。 DRAM刷新机制的大粒度使此问题更加严重。具体而言,即使在特定保留组中只有少量渗漏细胞时,该组仍被归类为渗漏组。因此,也以不必要的频率刷新了许多也属于该组的非泄漏单元。由于保留组的粒度较大,因此效率低下会变得很大。为了解决此问题,我们提出了一种新颖的保留意识更新方法,称为“精巧刷新”,以进一步减小保留组的粒度。精心刷新的关键思想是为每个芯片存储泄漏行地址,并同时刷新每个芯片中的不同泄漏行。这样,精心刷新可将泄漏组刷新的开销减少16倍。此外,精心制作的刷新功能将保留信息存储在DRAM芯片中,从而节省了刷新能量,即使在存储器控制器无法控制DRAM的自刷新模式下也是如此。

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  • 来源
    《Computers, IEEE Transactions on》 |2018年第10期|1403-1415|共13页
  • 作者单位

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Sociology; Statistics; Capacitors; DRAM chips; Transistors; Memory management;

    机译:社会学;统计;电容器;DRAM芯片;晶体管;内存管理;

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