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Computation of bit-error probabilities for optical receivers using thin avalanche photodiodes

机译:使用薄雪崩光电二极管的光接收器的误码率计算

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The large-deviation-based asymptotic-analysis and importance-sampling methods for computing bit-error probabilities for avalanche-photodiode (APD) based optical receivers, developed by Letaief and Sadowsky [IEEE Trans. Inform. Theory, vol. 38, pp. 1162-1169, 1992], are extended to include the effect of dead space, which is significant in high-speed APDs with thin multiplication regions. It is shown that the receiver's bit-error probability is reduced as the magnitude of dead space increases relative to the APD's multiplication-region width. The calculated error probabilities and receiver sensitivities are also compared with those obtained from the Chernoff bound.
机译:基于大偏差的渐近分析和重要性采样方法,用于计算基于雪崩光电二极管(APD)的光接收器的误码率,由Letaief和Sadowsky [IEEE Trans。通知。理论卷。 38,pp.1162-1169,1992],扩展到包括死区的影响,这在具有薄乘法区域的高速APD中很重要。结果表明,随着死区大小的增加(相对于APD乘法区域宽度),接收器的误码概率降低。还将计算出的错误概率和接收器灵敏度与从切尔诺夫边界获得的那些相比较。

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