A frequency response, harmonic distortion, and intermodulationdistortion test for BIST of a sigma-delta ADC

摘要

Built-In-Self-Test (BIST) for VLSI systems is desirable fornproduction-line testing and in-the-field diagnostics. This briefndiscusses a Mixed Analog-Digital BIST (MADBIST) for a frequency responsentest, a harmonic distortion test and an intermodulation distortion testnof an analog-to-digital converter. The MADBIST strategy for thenfrequency response, harmonic distortion, and intermodulation distortionntests of the ADC is introduced, accuracy issues are discussed, andnpreliminary experimental results are presented