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首页> 外文期刊>IEEE Transactions on Circuits and Systems. II, Express Briefs >Multibit Delta-Sigma Modulator With Two-Step Quantization and Segmented DAC
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Multibit Delta-Sigma Modulator With Two-Step Quantization and Segmented DAC

机译:具有两步量化和分段DAC的多位Delta-Sigma调制器

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摘要

An architecture for a multibit single-stage delta–sigma analog-to-digital converter (ADC) with two-step quantization is presented. Both the most significant bit and least significant bit signals produced by the two-step quantization are fed back simultaneously to all integrator stages, making it suitable for low oversampling ratios. The two-step ADC avoids the problem that the complexity of an internal flash ADC increases exponentially with each added bit. A segmented architecture with coarse/fine dynamic element matching (DEM) and digital-to-analog converter (DAC) is proposed to reduce the complexity of DEM and DAC due to the large internal quantizer. The consequence of the segmentation, mismatch between coarse and fine DACs can be noise shaped by using a digital requantization method. Analysis and behavioral simulation results are presented.
机译:提出了一种具有两步量化的多位单级delta-sigma模数转换器(ADC)的体系结构。由两步量化产生的最高有效位和最低有效位信号都同时反馈到所有积分器级,使其适用于低过采样率。两步ADC避免了内部闪存ADC的复杂度随每个增加的位呈指数增长的问题。提出了一种具有粗/细动态元素匹配(DEM)和数模转换器(DAC)的分段架构,以减少由于内部量化器较大而导致的DEM和DAC的复杂性。通过使用数字重新量化方法,可以对噪声,粗略DAC与精细DAC之间的不匹配进行分割,从而对噪声产生影响。给出了分析和行为仿真结果。

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