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IRD Digital Background Calibration of SAR ADC With Coarse Reference ADC Acceleration

机译:具有粗略基准ADC加速度的SAR ADC的IRD数字本底校准

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摘要

A coarse analog-to-digital converter (ADC) is used as the reference path to resolve the input interference problem in correlation-based background calibration of multistep ADCs. A 16-bit successive-approximation-register (SAR) ADC employing a subbinary architecture is calibrated with an 8-bit reference path, achieving a nearly 20 × reduction in convergence time and greatly improved steady-state linearity performance in simulation. The SAR ADC bit-weight calibration is based on the principle of internal redundancy dithering (IRD), a technique in which the bit decision thresholds are dithered by a pseudorandom bit sequence (PRBS) within the redundancy region. Aided by the coarse reference ADC, behavioral simulation shows that 89-dB signal-to-noise plus distortion ratio and the 115-dB spurious-free dynamic range (SFDR) are achievable with the proposed calibration for a SAR ADC with 1% digital-to-analog converter mismatch errors.
机译:在多步ADC的基于相关的背景校准中,使用粗略的模数转换器(ADC)作为参考路径来解决输入干扰问题。采用8位参考路径对采用子二进制架构的16位逐次逼近寄存器(SAR)ADC进行了校准,从而使收敛时间缩短了近20倍,并大大提高了仿真中的稳态线性度性能。 SAR ADC的位权重校准基于内部冗余抖动(IRD)原理,该技术通过冗余区域内的伪随机位序列(PRBS)来抖动位决策阈值。在粗略基准ADC的辅助下,行为仿真表明,对于具有1%数字噪声的SAR ADC提出的校准建议,可以实现89dB的信噪加失真比和115dB的无杂散动态范围(SFDR)。模转换器不匹配错误。

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