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A Four-Step Incremental ADC Based on Double Extended Binary Counting With Capacitive DAC

机译:基于双延长二进制计数的四步增量ADC,电容DAC计数

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摘要

This brief proposes a discrete-time four-step reconfigurable incremental ADC (IADC) which consists of a first-step SAR conversion, a second-step IADC operation, and double extended binary counting (EBC). While coarse conversion with the 8b SAR ADC is preceded, instead of 8b DAC, 7b capacitive DAC based integrator operation in the IADC becomes available to reduce the chip area and power consumption of amplifier. Additional resolution is achieved by performing the EBC twice, where its conversion time is reduced by using the binary operation with a 7b capacitive DAC. The IADC and the EBC are reconfigured to utilize the same sub-blocks of one amplifier and one comparator, thus reducing silicon area and obtaining high linearity. A prototype ADC is fabricated in a 180-nm CMOS process, and it achieves 179.7 dB FoM and consumes 176 mu W.
机译:本简述提出了一种离散时间的四步可重新配置增量ADC(IADC),其包括第一步SAR转换,第二步IADC操作和双重扩展二进制计数(EBC)。在使用8B SAR ADC的粗转换之后,而不是8B DAC,IADC中的基于7B电容DAC的积分器操作可用于降低放大器的芯片区域和功耗。通过执行两次EBC来实现附加分辨率,其中通过使用具有7B电容DAC的二进制操作来减少其转换时间。重新配置IADC和EBC以利用一个放大器和一个比较器的相同子块,从而减少硅面积并获得高线性度。原型ADC在180nm CMOS工艺中制造,它达到179.7dB的FOM并消耗176亩W.

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