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Advanced surface protection for improved reliability PCB systems (ASPIS)

机译:先进的表面保护,可改善可靠性的PCB系统(ASPIS)

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Purpose - The purpose of this paper is to detail progress on the European Commission supported FP7 ASPIS project that is undertaking a multi-faceted approach to develop novel and improved nickel-gold (ENIG) solderable finish chemistries and processes in order to overcome issues such as "black pad" that are known to cause reliability issues. Design/methodology/approach - The ASPIS project has four key and discrete approaches; research into "black pad" formation mechanisms, development of new aqueous chemical deposition methods, formulation of new processes based on ionic liquids and the development of prognostic screening tools to enable early prediction of reliability issues. Findings - Key factors influencing "black pad" formation include immersion gold bath pH value, concentration of citrate and thickness of the immersion gold layer. In addition, copper substrate preparation is also important. Work to develop new metal deposition processes using ionic liquids has also been demonstrated and may provide a viable alternative to more conventional aqueous based chemistries, thereby enabling some of the conditions that lead to "black pad" to be avoided. Research limitations/implications - This paper summarises the work carried out in the first year of a three-year project and so the outputs to date are relatively limited. The project is continuing for another two years, when further progress will be made. It is hoped to report this progress in a future update paper. Originality/value - The ASPIS project has undertaken multiple approaches to the development of new high reliability nickel gold finishes and this combination of approaches should offer synergies over more discrete traditional methodologies. As well as undertaking a detailed analysis of the mechanisms causing reliability problems, radical new formulation and prognostic approaches are also being developed.
机译:目的-本文的目的是详细说明欧盟委员会支持的FP7 ASPIS项目的进展,该项目正在采取多方面的方法来开发新颖且经过改进的镍金(ENIG)可焊性化学剂和工艺,从而克服诸如已知会导致可靠性问题的“黑垫”。设计/方法/方法-ASPIS项目具有四个关键且离散的方法;研究“黑垫”的形成机理,开发新的水性化学沉积方法,制定基于离子液体的新工艺以及开发能够进行可靠性问题早期预测的预后筛查工具。研究结果-影响“黑垫”形成的关键因素包括沉金浴的pH值,柠檬酸盐浓度和沉金层的厚度。另外,铜基板的准备也很重要。还已经证明了使用离子液体开发新的金属沉积工艺的工作,并且可以为更常规的水基化学试剂提供可行的替代方法,从而可以避免导致“黑垫”的某些情况。研究的局限性/意义-本文总结了一个为期三年的项目在第一年中所做的工作,因此迄今为止的产出相对有限。该项目将再进行两年,届时将取得进一步的进展。希望在将来的更新文件中报告此进展。原创性/价值-ASPIS项目采用了多种方法来开发新的高可靠性镍金饰面,并且这些方法的结合应该在更离散的传统方法上提供协同作用。除了对引起可靠性问题的机制进行详细分析之外,还正在开发新的新方法和预测方法。

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