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首页> 外文期刊>Canadian journal of electrical and computer engineering >Permittivity measurement of disk and annular dielectric samples using coaxial transmission line fixtures. Part II: Experimentation and accuracy analyses
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Permittivity measurement of disk and annular dielectric samples using coaxial transmission line fixtures. Part II: Experimentation and accuracy analyses

机译:使用同轴传输线夹具测量磁盘和环形介电样品的介电常数。第二部分:实验和准确性分析

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摘要

An improved permittivity measurement technique for dielectric disks involving S-parameter measurement of a two-port coaxial transmission line fixture is presented. The previous form of the method suffers from variation of the retrieved permittivity with frequency, which leads to inaccuracies that may be severe at some frequencies. An extension of the method that reduces these errors is devised. In addition, an independently developed new technique for measuring the permittivity of annular samples via quadratic curve fitting is presented. This technique also involves S-parameter measurement of a coaxial fixture and requires measurement of only three known materials (one of them may be free space, in which case the requirement is reduced to only two solid dielectrics). The permittivity of any unknown dielectric may subsequently be determined with high accuracy over a wide frequency range. The method is based on the premise that the variation of the reflection characteristics of the two-port coaxial transmission line fixture with the permittivity of the sample displays a strongly quadratic behaviour. This paper constitutes the second of two parts of this work. Part I, also appearing in this issue, presents the theoretical formulation for the moment method mode-matching treatment of the coaxial fixture for treating annular samples. In the present paper, the measurement techniques are described, and numerical simulations of the experimental procedure based on the theory of Part I are presented. In addition, comparative results of accuracy for these two approaches are given. Sensitivity analyses are also presented, along with preliminary experimental results.
机译:提出了一种改进的介电常数测量技术,该技术涉及两端口同轴传输线夹具的S参数测量。该方法的先前形式遭受所获取的介电常数随频率的变化的影响,这导致在某些频率下可能很严重的误差。设计了减少这些错误的方法的扩展。此外,提出了一种独立开发的通过二次曲线拟合测量环形样品介电常数的新技术。该技术还涉及同轴夹具的S参数测量,并且仅需要测量三种已知的材料(其中一种可以是自由空间,在这种情况下,要求减少到只有两种固体电介质)。随后可以在宽的频率范围内以高精度确定任何未知电介质的介电常数。该方法基于这样的前提,即两端口同轴传输线夹具的反射特性随样品介电常数的变化表现出很强的二次行为。本文构成了这项工作的两个部分的第二部分。第一部分(也出现在本期中)介绍了用于处理环形样品的同轴夹具的矩量法模式匹配处理的理论公式。本文介绍了测量技术,并基于第一部分的理论对实验过程进行了数值模拟。另外,给出了这两种方法的准确性的比较结果。还介绍了灵敏度分析,以及初步的实验结果。

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