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Transfer of a single particle for combined ESEM and TEM analyses

机译:转移单个颗粒以进行ESEM和TEM分析

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摘要

A new approach for transferring micrometer-sized particles between different sample holders has been developed using manipulators within an environmental scanning electron microscope (ESEM) sample chamber. Particles are transported from one sample holder to another using glass needles attached to manipulators, which allows a combination of microanalytical techniques for detailed analysis of specific particles. The technique was applied to airborne particles sampled in downtown Zurich, Switzerland. Initial, qualitative analysis of morphology and chemistry using the ESEM, led to the distinction of five particle classes. In order to investigate the structure of selected particles further, a specific particle was transferred to a transmission electron microscope (TEM) grid. The combination of analytical methods (ESEM-EDX and TEM) allowed us to characterize this particle in more detail and to identify its source. Thus, the approach presented here can be used to resolve the complex structure of single particles and to refine source apportionment based on single particle analysis.
机译:使用环境扫描电子显微镜(ESEM)样品室内的机械手,开发了一种在不同样品架之间转移微米级颗粒的新方法。使用连接到操纵器的玻璃针将颗粒从一个样品架转移到另一个样品架,这允许使用微分析技术的组合来对特定颗粒进行详细分析。该技术被应用于在瑞士苏黎世市中心采样的空气传播颗粒。使用ESEM对形态和化学进行的初步定性分析导致了五种颗粒类别的区别。为了进一步研究所选粒子的结构,将特定粒子转移到透射电子显微镜(TEM)网格中。分析方法(ESEM-EDX和TEM)的结合使我们能够更详细地表征该颗粒并确定其来源。因此,此处介绍的方法可用于解析单个粒子的复杂结构,并基于单个粒子分析来完善源分配。

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