A simplified analysis on buckling of stressed and pressurized thin films on substrates

摘要

This paper is concerned with effect of mismatched pressure on buckling of stressed thin films on a semi-infinite rigid substrate. Analytical approximate solutions are established in explicit form by using total potential energy of the system and the Rayleigh-Ritz's method, and their stabilities have also been determined. The dependences of the critical stress and film-center deflection on the mismatched pressure have been formulated. Results are compared with exact or numerical shooting solutions, and excellent agreements are observed for a large range of film-center deflection. These expressions are brief and can easily be used to derive the effects of various parameters on mechanical behavior of films.