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Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N-2 plasma

机译:N-2等离子体钝化的InP(100)表面的俄歇电子能谱和电特性

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Auger electron spectroscopy (AES) was used to investigate the processes taking place during the initial stages of InP(100) surfaces nitridation. This AES study combined with electrical measurements (intensity-voltage) shows that the processes greatly differ depending on the nitridation angles. Results show that with grazing angle for nitrogen flow, the nitridation process is more efficient. Results obtained with AES spectra are coherent with electrical measurements: Hg/InN/InP(100) Schottky diodes present different electrical characteristics for the grazing and normal flow. The passivation effect of the nitride layers depends on the incident nitrogen angle flow. (C) 2004 Elsevier B.V. All rights reserved.
机译:俄歇电子能谱(AES)用于研究InP(100)表面氮化初始阶段发生的过程。这项AES研究与电学测量(强度-电压)相结合,表明该过程根据氮化角度的不同而有很大差异。结果表明,在氮气流掠射角较大的情况下,氮化过程更为有效。用AES光谱获得的结果与电学测量结果是一致的:Hg / InN / InP(100)肖特基二极管为掠食和正常流动提供了不同的电学特性。氮化物层的钝化效果取决于入射氮角流。 (C)2004 Elsevier B.V.保留所有权利。

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