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Electrical characteristics of UV photodetectors based on ZnO/diamond film structure

机译:基于ZnO /金刚石膜结构的紫外光电探测器的电学特性

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Ultraviolet photodetectors based on ZnO diamond film structure were fabricated. The properties of Au/ZnO contacts and effects of grain sizes on the electrical characteristics of photodetectors were discussed. Due to the bombardment with Au atoms and the annealing process, fine ohmic contacts were formed between Au electrodes and ZnO films. Dark currents and photocurrents of the photodetectors were related to sputtering time and the grain size of ZnO films. For the photodetector with a bigger grain size, a lower dark current and a higher photocurrent were obtained under 10 V bias voltage. The time-dependent photocurrent confirmed the carrier trapping effect.
机译:制作了基于ZnO金刚石薄膜结构的紫外光电探测器。讨论了Au / ZnO接触的特性以及晶粒尺寸对光电探测器电学特性的影响。由于用金原子轰击和退火工艺,在金电极和ZnO薄膜之间形成了精细的欧姆接触。光电探测器的暗电流和光电流与溅射时间和ZnO薄膜的晶粒尺寸有关。对于具有较大晶粒尺寸的光电检测器,在10 V偏置电压下可获得较低的暗电流和较高的光电流。随时间变化的光电流证实了载流子的俘获作用。

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