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Surface Energy And Hybridization Studies Of Amorphous Carbon Surfaces

机译:非晶碳表面的表面能和杂化研究

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Surface properties of a large number of amorphous carbon (a-C) films have been investigated using contact angle measurements and X-ray photoelectron spectroscopy (XPS). Dense a-C surfaces with variable sp~3/(sp~2 + sp~3) average hybridization were grown using sputtering or pulsed laser deposition (PLD) and were further chemically modified by thermal annealing, ion bombardment or covalent grafting of organic monolayers. The average carbon hybridization, impurity level and mass density, were deduced from XPS and photoelectron energy loss spectroscopy (PEELS). The depth sensitivity of the dispersive (Lifshitz-van der Waals) interaction, estimated at 1-2 nm from the dependence of γ~(LW) on the grafted perflorodecene molecule coverage, is much better than XPS which probes a 3-5 nm depth. The observation of a non-monotonic behavior in the correlation between surface hybridization and electron donor component of surface energy reveals that the average carbon hybridization alone does not describe the entire surface energy physics. The role of π bond clustering in the polar interactions is thus considered and some implications on surface reactivity and mutual interactions with molecular or biomolecular species are discussed.
机译:已经使用接触角测量和X射线光电子能谱(XPS)研究了大量非晶碳(a-C)膜的表面特性。使用溅射或脉冲激光沉积(PLD)生长具有可变sp〜3 /(sp〜2 + sp〜3)平均杂化的致密a-C表面,并通过热退火,离子轰击或有机单层共价接枝进一步化学修饰。从XPS和光电子能量损失谱(PEELS)推算出平均碳杂化,杂质水平和质量密度。从γ〜(LW)对嫁接的全十二碳烯分子覆盖率的依赖性估计,色散(Lifshitz-van der Waals)相互作用的深度敏感性为1-2 nm,比探测3-5 nm深度的XPS更好。 。在表面杂化与表面能的电子给体成分之间的相关性中观察到非单调性的行为表明,仅平均碳杂化并不能描述整个表面能物理学。因此考虑了π键簇在极性相互作用中的作用,并讨论了对表面反应性以及与分子或生物分子种类的相互作用的一些暗示。

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