XRD and XPS analysis of laser treated vanadium oxide thin films

摘要

In this work, we present X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of laser treated vanadium oxide sols. The films were also observed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) to reveal how the original xerogel structure changes into irregular shaped, layer structured V_2O_5 due to the laser radiation. XRD revealed that above 102 W/cm~2 the original xerogel structure disappears and above 129 W/cm~2 the films become totally polycrystalline with an orthorhombic structure. XPS spectra showed O/V ratio increment by using higher laser intensities.