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Modification of the surface state and doping of CdTe and CdZnTe crystals by pulsed laser irradiation

机译:脉冲激光辐照改性CdTe和CdZnTe晶体的表面状态和掺杂

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摘要

The photoelectric and electrical properties of high-resistivity p-like CdTe and Cd_(0.96)Zn_(0.04)Te single crystals and barrier structures on their base before and after laser irradiation in different conditions are studied. Irradiation of samples with nanosecond ruby laser pulses was carried out in two different ways. In the first case, the Cd(Zn)Te crystals were subjected to laser action directly from the surface and irradiation within a certain range of intensities resulted in a decrease in the surface recombination rate and increase in the photoconductivity signal. The surface region with a wider bandgap in CdZnTe crystals was formed. In the second case, the samples were irradiated from the side pre-coated with a relatively thick In dopant film and it caused rectification in the 1-V characteristics as a result of laser-induced doping of the thin Cd(Zn)Te surface region and formation of a built-in p-n junction. The application of the fabricated M-p-n structured In/Cd(Zn)Te/Au diodes for X-ray and 7-ray detectors is discussed.
机译:研究了高电阻率p型CdTe和Cd_(0.96)Zn_(0.04)Te单晶的光电性能以及在不同条件下激光辐照前后的垒垒结构。用纳秒级红宝石激光脉冲辐照样品的方式有两种。在第一种情况下,直接从表面对Cd(Zn)Te晶体进行激光作用,并在一定强度范围内进行辐照,导致表面复合率降低,光电导信号增加。在CdZnTe晶体中形成了带隙较宽的表面区域。在第二种情况下,从预涂有相对较厚的In掺杂剂薄膜的一面照射样品,并且由于激光诱导的Cd(Zn)Te薄表面区域的掺杂而导致1-V特性的整流。并形成一个内置的pn结。讨论了制造的M-p-n结构的In / Cd(Zn)Te / Au二极管在X射线和7射线探测器中的应用。

著录项

  • 来源
    《Applied Surface Science》 |2009年第24期|9813-9816|共4页
  • 作者单位

    Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8011, Japan V.E. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine;

    Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8011, Japan;

    V.E. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, prospekt Nauky 41, Kyiv 03028, Ukraine;

    Technological Educational Institute of Halkis, Thesi Skliro Street, Psahna, Evia, CR 34400, Greece;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CdTe and CdZnTe barrier structures; laser irradiation; photoconductivity; I-V Characteristics;

    机译:CdTe和CdZnTe势垒结构;激光照射光电导性I-V特性;
  • 入库时间 2022-08-18 03:07:50

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