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Impedometric anion sensing behaviour of In_xGa_(1-x)N films grown by modified activated reactive evaporation

机译:改进的活化反应蒸发生长的In_xGa_(1-x)N薄膜的阻抗学阴离子传感行为

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摘要

In the present work, In_xGa_(1-x)N films with different indium compositions (x = 0.88, 0.63, 0.36 and 0.18) were prepared on glass substrates using a commercially viable technique known as modified activated reactive evaporation. Electrochemical impedance was used to investigate the anion sensing properties of these films for KC1, KI and KNO3 salt solutions of different molar concentrations. The anion sensing behaviour of InGaN films is attributed to the presence of high n-type background carrier concentration and positively charged surface donor states. The InGaN based anion sensors were found to have good sensitivity with faster response and recovery time. The film with x = 0.63 was found to have the highest sensitivity for all the anions due to the presence of more active surface area together with large number of surface donor states.
机译:在本工作中,使用已知为改性活化反应蒸发的商业可行技术,在玻璃基板上制备了具有不同铟成分(x = 0.88、0.63、0.36和0.18)的In_xGa_(1-x)N膜。电化学阻抗用于研究这些膜对不同摩尔浓度的KCl,KI和KNO3盐溶液的阴离子感测特性。 InGaN膜的阴离子感测行为归因于高n型背景载流子浓度和带正电的表面施主态。发现基于InGaN的阴离子传感器具有良好的灵敏度,具有更快的响应和恢复时间。发现x = 0.63的薄膜对所有阴离子具有最高的灵敏度,这是由于存在更多的活性表面积以及大量的表面施主态。

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