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首页> 外文期刊>Applied Surface Science >Depth prediction model of nano-grooves fabricated by AFM-based multi-passes scratching method
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Depth prediction model of nano-grooves fabricated by AFM-based multi-passes scratching method

机译:基于AFM的多道次划痕法制备的纳米沟槽深度预测模型

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摘要

This paper proposes a nano-groove depth prediction model for the atomic force microscopy (AFM)-based multi-passes scratching method in which the AFM tip is considered as a cone with a spherical apex. The relationship between the normal load applied on the sample and the depth of the machined nano-groove is systematically investigated for the multi-passes scratching process. Nano-grooves are fabricated with several normal loads and two passes scratches on a 2A12 aluminum alloy surface to verify the developed models. Results show that the hardness may become larger near the machined region after one pass scratching test and a correction factor is introduced into the two passes scratching model which is as a function of the first pass machined depths of the nano-grooves. Based on the correction model, several nano-grooves with an expected depth are machined with different normal loads for each pass in the two passes scratching tests and the difference between the experiment results and the expected values is less than 10%. Actually, to machine a nano-groove with a desired depth, this method has the potential to distribute the appropriate normal load applied for each pass to reduce the tip wear and be used for nano-groove depth correction using the multi passes scratching technique.
机译:本文提出了一种基于原子力显微镜(AFM)的多道次划痕方法的纳米沟槽深度预测模型,该模型将AFM尖端视为具有球形顶点的圆锥体。对于多道次刮擦过程,系统地研究了施加在样品上的法向载荷与机械加工纳米槽深度之间的关系。纳米沟槽在2A12铝合金表面上具有几个正常载荷和两次擦伤痕迹,以验证开发的模型。结果表明,在一次通过刮擦试验之后,硬度可能会在加工区域附近变大,并且将校正因子引入到两次通过刮擦模型中,该校正因子是纳米槽第一次加工深度的函数。基于校正模型,在两次通过刮擦测试中,每次通过的几次具有预期深度的纳米凹槽均以不同的法向载荷加工,并且实验结果与期望值之间的差异小于10%。实际上,为了加工具有所需深度的纳米凹槽,此方法有可能分配施加给每个行程的适当法向载荷以减少尖端磨损,并可以使用多行程刮擦技术将其用于纳米凹槽深度校正。

著录项

  • 来源
    《Applied Surface Science》 |2014年第15期|615-623|共9页
  • 作者单位

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

    Key Laboratory of Micro-systems and Micro-structures Manufacturing of Ministry of Education, Department of Mechanical Engineering, Harbin Institute of Technology, Xidazhijie 92, PO Box 413, Harbin 150001, Heilongjiang, People's Republic of China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Atomic force microscopy (AFM); Multi-passes nanoscratching; Depth prediction; Normal load;

    机译:原子力显微镜(AFM);多遍纳米划痕;深度预测;正常负载;

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