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Nanostructured hydrophobic DC sputtered inorganic oxide coating for outdoor glass insulators

机译:用于室外玻璃绝缘体的纳米结构疏水性直流溅射无机氧化物涂层

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摘要

We report the structural, optical and electrical properties of nanostructured hydrophobic inorganic hafnium oxide coating for outdoor glass insulator using DC sputtering technique to combat contamination problem. The properties were studied as a function of DC power. The characterization of the films was done using X-ray diffraction, EDS, surface profilometer, AFM, impedance analyser and water contact angle measurement system. The DC power was varied from 30 to 60 W and found to have a great impact on the properties of hafnium oxide. All the deposited samples were polycrystalline with nanostructured hydrophobic surfaces. The intensity of crystallinity of the film was found to be dependent on sputtering power and hydrophobicity was correlated to the nanoscale roughness of the films. The optical property reveals 80% average transmission for all the samples. The refractive index was found in the range of 1.85-1.92, near to the bulk value. The band gap calculated from transmission data was >5.3eV for all deposited samples ensuring dielectric nature of the films. Surface energy calculated by two methods was found minimum for the film deposited at 50 W sputtering power. The resistivity was also high enough (~10~4 Ω2 cm) to hinder the flow of leakage current through the film. The dielectric constant (ε) was found to be thickness dependent and also high enough (ε_(max) = 23.12) to bear the large electric field of outdoor insulators.
机译:我们报告了用于室外玻璃绝缘体的纳米结构疏水性无机氧化oxide纳米涂层的结构,光学和电学性能,采用直流溅射技术来解决污染问题。研究了这些特性与直流功率的关系。使用X射线衍射,EDS,表面轮廓仪,AFM,阻抗分析仪和水接触角测量系统对薄膜进行表征。直流功率从30 W到60 W不等,发现对氧化f的性能有很大影响。所有沉积的样品都是具有纳米结构疏水表面的多晶。发现膜的结晶强度取决于溅射功率,并且疏水性与膜的纳米级粗糙度相关。光学性质表明所有样品的平均透射率为80%。发现折射率在1.85-1.92的范围内,接近整体值。对于所有沉积的样品,由透射数据计算出的带隙均大于5.3eV,从而确保了薄膜的介电性质。对于以50 W溅射功率沉积的薄膜,发现通过两种方法计算出的表面能最小。电阻率也足够高(〜10〜4Ω2cm),以阻止泄漏电流流过薄膜。发现介电常数(ε)与厚度有关,并且也足够高(ε_(max)= 23.12)以承受室外绝缘子的大电场。

著录项

  • 来源
    《Applied Surface Science》 |2014年第15期|231-239|共9页
  • 作者

    V. Dave; H.O.Gupta; R.Chandra;

  • 作者单位

    Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee 247667, India,Institute Instrumentation Centre, Indian Institute of Technology, Roorkee, Roorkee 247667, India;

    Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee 247667, India;

    Institute Instrumentation Centre, Indian Institute of Technology, Roorkee, Roorkee 247667, India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hydrophobicity; Contamination; Dielectric; Surface energy; Resistivity;

    机译:疏水性污染;电介质表面能电阻率;

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