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Effects of rf power on chemical composition and surface roughness of glow discharge polymer films

机译:射频功率对辉光放电聚合物薄膜化学成分和表面粗糙度的影响

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The glow discharge polymer (GDP) films for laser fusion targets were successfully fabricated by plasma enhanced chemical vapor deposition (PECVD) at different radio frequency (rf) powers. The films were deposited using trans-2-butene (T2B) mixed with hydrogen as gas sources. The composition and state of plasma were diagnosed by quadrupole mass spectrometer (QMS) and Langmuir probe during the deposition process. The composition, surface morphology and roughness were investigated by Fourier transform infrared spectroscopy (FTIR), scanning electron microscope (SEM) and white-light interferometer (WLI), respectively. Based on these observation and analyses, the growth mechanism of defects in GDP films were studied. The results show that, at low rf power, there is a larger probability for secondary polymerization and formation of multi-carbon C-H species in the plasma. In this case, the surface of GDP film turns to be cauliflower-like. With the increase of rf power, the degree of ionization is high, the relative concentration of smaller-mass hydrocarbon species increases, while the relative concentration of larger-mass hydrocarbon species decreases. At higher rf power, the energy of smaller-mass species are high and the etching effects are strong correspondingly. The GDP film's surface roughness shows a trend of decrease firstly and then increase with the increasing rf power. At rf power of 30 W, the surface root-mean-square roughness (Rq) drops to the lowest value of 12.8 nm, and no "void" defect was observed. (C) 2016 Elsevier B.V. All rights reserved.
机译:通过等离子体增强化学气相沉积(PECVD)在不同的射频(rf)功率下成功制造了用于激光聚变靶的辉光放电聚合物(GDP)膜。使用与氢气混合的反式-2-丁烯(T2B)作为气源沉积薄膜。在沉积过程中,通过四极质谱仪(QMS)和Langmuir探针诊断血浆的组成和状态。用傅里叶变换红外光谱仪(FTIR),扫描电子显微镜(SEM)和白光干涉仪(WLI)分别研究了其成分,表面形貌和粗糙度。在这些观察和分析的基础上,研究了GDP薄膜缺陷的生长机理。结果表明,在低射频功率下,等离子体中发生二次聚合和形成多碳C-H物种的可能性更大。在这种情况下,GDP膜的表面变成菜花状。随着射频功率的增加,电离度高,小质量烃种类的相对浓度增加,而大质量烃种类的相对浓度降低。在较高的射频功率下,较小质量物质的能量较高,蚀刻效果也相应较强。 GDP膜的表面粗糙度呈现出随rf功率的增大先减小后增大的趋势。在30 W的rf功率下,表面均方根粗糙度(Rq)降至最低的12.8 nm,并且未观察到“空洞”缺陷。 (C)2016 Elsevier B.V.保留所有权利。

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