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Improvement of electron emission characteristics of porous silicon emitter by using cathode reduction and electrochemical oxidation

机译:通过阴极还原和电化学氧化改善多孔硅发射体的电子发射特性

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摘要

A new simple and convenient post-treat technique combined the cathode reduction (CR) and electrochemical oxidation (ECO) was proposed to improve the electron emission properties of the surface-emitting cold cathodes based on the porous silicon (PS). It is demonstrated here that by introducing this new technique combined CR and ECO, the emission properties of the diode have been significantly improved than those as-prepared samples. The experimental results showed that the emission current densities and efficiencies of sample treated by CR were 62 mu A/cm(2) and 12.10%, respectively, nearly 2 orders of magnitude higher than those of as-prepared sample. Furthermore, the CR-treated PS emitter shows higher repeatability and stability compared with the as-prepared PS emitter. The scanning electron microscope (SEM), atomic force microscope (AFM), energy dispersive spectrometer (EDS), furier transformed infrared (FTIR) spectroscopy results indicated that the improved mechanism is mainly due to the passivation of the PS, which not only improve the PS morphology by the passivation of the H+ but also improve the uniformity of the oxygen content distribution in the whole PS layer. Therefore, the method combined the CR treatment and ECO is expected to be a valuable technique to enhance the electron emission characteristics of the PS emitter. (C) 2016 Elsevier B.V. All rights reserved.
机译:提出了一种结合阴极还原(CR)和电化学氧化(ECO)的新的简便便捷的后处理技术,以改善基于多孔硅(PS)的表面发射冷阴极的电子发射性能。在此证明,通过引入这种结合了CR和ECO的新技术,二极管的发射性能比所准备的样品得到了显着改善。实验结果表明,经过CR处理的样品的发射电流密度和效率分别为62μA/ cm(2)和12.10%,比制备的样品高近2个数量级。此外,与准备好的PS发射器相比,经CR处理的PS发射器显示出更高的可重复性和稳定性。扫描电子显微镜(SEM),原子力显微镜(AFM),能量色散光谱仪(EDS),更进一步的红外光谱(FTIR)光谱结果表明,改进的机理主要归因于PS的钝化,不仅改善了PS通过H +钝化的PS形态,还可以改善整个PS层中氧含量分布的均匀性。因此,期望将CR处理和ECO相结合的方法是增强PS发射体的电子发射特性的有价值的技术。 (C)2016 Elsevier B.V.保留所有权利。

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