Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006)

Sahoo N. K.; Thakur S.; Tokas R. B.

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Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006)

机译：相位调制光谱椭偏技术分析共沉积Gd2O3 / SiO2复合薄膜（Vol 253，Pg 1787，2006）

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《Applied Surface Science》 |2018年第ptaa期|1280-1280|共1页
作者
Sahoo N. K.; Thakur S.; Tokas R. B.;
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Bhabha Atom Res Ctr, Spect Div, Bombay 400085, Maharashtra, India;

Bhabha Atom Res Ctr, Spect Div, Bombay 400085, Maharashtra, India;

Bhabha Atom Res Ctr, Spect Div, Bombay 400085, Maharashtra, India;

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1. Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique [J] . Sahoo NK, Tokas RB, Thakur S Applied Surface Science . 2006,第4期

机译：相位调制光谱椭偏法分析共沉积Gd2O3 / SiO2复合薄膜
2. Analysis of codeposited Gd_2O_3/SiO_2 composite thin films by phase modulated spectroscopic ellipsometric technique [J] . N.K. Sahoo, R.B. Tokas, S. Thakur Applied Surface Science . 2006,第4期

机译：相位调制光谱椭偏法分析共沉积Gd_2O_3 / SiO_2复合薄膜
3. Morphological, microstructural and optical properties supremacy of binarycomposite films-A study based on Gd2O3/SiO2 system (Retraction of Vol 253, Pg 3455, 2006) [J] . Sahoo N. K., Thakur S., Tokas R. B. Applied Surface Science . 2018,第ptaa期

机译：二元复合薄膜的形貌，微观结构和光学性质至上-基于Gd2O3 / SiO2系统的研究（Vol 253，Pg 3455，2006）
4. Characterization of Gadolinium oxide thin films deposited under low ambient substrate temperature using Phase Modulated Spectroscopic Ellipsometry [C] . S. Thakur, N.K. Sahoo, M. Senthilkumar, Indian Vacuum Society National Symposium on Vacuum Science amp; Technology and Vacuum Metallurgy(IVSNS 2003); 20031015-17; Mumbai(IN) . 2003

机译：使用相调制光谱椭圆仪表征在低环境衬底温度下沉积的氧化Ga薄膜。
5. Determination of Au Film Thiolation and Silane Bonding Onto SiO2 Films Within the Frame of Biosensor Surface Functionalization – an Analysis of Best Practices and Techniques [O] . Leda G. Bousiakou, Stefanos Karapetis 2020

机译：生物传感器表面官能化框架内SiO 2膜在SiO2膜上的测定 - 一种最佳实践与技术的分析
6. Two-channel spectroscopic polarization modulation ellipsometry. A new technique for the analysis thin SiO2 films. [R] . G. E. Jellison 1991

机译：双通道光谱偏振调制椭偏仪。一种分析薄siO2薄膜的新技术。

Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006)

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