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首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Growth by MOMBE of c-axis superconducting YBCO thin films on different substrates: in situ RHEED monitoring of the growth
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Growth by MOMBE of c-axis superconducting YBCO thin films on different substrates: in situ RHEED monitoring of the growth

机译:通过MOMBE在不同基板上生长c轴超导YBCO薄膜:原位RHEED监测生长

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摘要

Superconducting YBCO c-axis oriented thin films have been grown by MOMBE (metalorganic molecular-beam-epitaxy). Growth of the films on different substrates [100] (Y,Nd)AlO3, [100] SrTiO3 and [100] MgO has been investigated by in situ monitoring the reflection high energy electron diffraction (RHEED). The paper discusses our results suggesting significant differences in films growth on the three presented substrates. The highest quality (high uniformity, epitaxy and low roughness) has been attained for the films prepared on SrTiO3. All films, regardless substrates, have shown values between 81 and 84 K for zero resistance critical temperature Tc0.
机译:通过MOMBE(金属有机分子束外延)生长了超导YBCO c轴取向薄膜。通过原位监测反射高能电子衍射(RHEED),研究了在不同衬底[100](Y,Nd)AlO3,[100] SrTiO3和[100] MgO上薄膜的生长。本文讨论了我们的结果,表明在上述三种基材上的薄膜生长存在显着差异。在SrTiO3上制备的薄膜已达到最高质量(高均匀性,外延和低粗糙度)。对于零电阻临界温度Tc0,所有膜,无论是哪种基板,都显示出介于81和84 K之间的值。

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