首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Removal of supermicron particles from precursor powders for PIT fabrication of Nb/sub 3/Sn and Bi-2212 multifilament conductors
【24h】

Removal of supermicron particles from precursor powders for PIT fabrication of Nb/sub 3/Sn and Bi-2212 multifilament conductors

机译:从前体粉末中去除超微粒子,以PIT制造Nb / sub 3 / Sn和Bi-2212复丝导体

获取原文
获取原文并翻译 | 示例
           

摘要

A technique is being developed for separating all particles larger than /spl sim/1 micron from the precursor powders that are used in powder-in-tube (PIT) fabrication of superconductors. For both Nb/sub 3/Sn and Bi-2212, elimination of large particles enables drawing a multi-filament restack to smaller final filament size, with benefits for overall current density and suppression of persistent current effects. The technique uses virtual impact (VI) sizing, in which the powder is dispersed in an aerosol stream and passed through a nozzle array which separates particles larger and smaller than a critical size into separate flow channels. Unlike other separation techniques, VI exhibits a sharp threshold and yields extremely clean removal of large particles. Successful operation of a pilot system, studies of the separation dynamics, and issues relating to scale-up are presented.
机译:正在开发一种技术,用于从超导体的管内粉末(PIT)制造中使用的前驱粉中分离出所有大于/ spl sim / 1微米的颗粒。对于Nb / sub 3 / Sn和Bi-2212而言,消除大颗粒可将多根细丝重新堆叠为更小的最终细丝尺寸,从而有利于总体电流密度和抑制持续电流效应。该技术使用虚拟冲击(VI)分级,其中粉末分散在气溶胶流中,并通过喷嘴阵列,该喷嘴阵列将大于和小于临界尺寸的颗粒分离到单独的流动通道中。与其他分离技术不同,VI的阈值很高,可以非常干净地清除大颗粒。介绍了中试系统的成功运行,分离动力学的研究以及与放大有关的问题。

著录项

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号