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The relationship between bit-error rate, operating speed and circuit scale of SFQ circuits

机译:SFQ电路的误码率,工作速度和电路规模之间的关系

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摘要

Timing jitter is an important constraint for the performance of SFQ circuits. We focus on the timing jitter in a Josephson transmission line (JTL) that induces timing errors at logic gates. A proper data analysis of 2-bit shift registers gave a jitter value of about 0.08 ps for a single Josephson junction in a JTL powered at a designed bias current. The variations in timing parameters of logic cells also give rise to timing errors. We experimentally determined the timing parameters in several logic cells and found that the deviations between actual and nominal values are within 2 ps. The relationship between the gray zone and circuit scale was estimated by extrapolating the transition curves observed in 2-bit shift registers. The estimated circuit scale was 20,000-100,000 JJs and 1,000 JJs at an operating clock frequency of 20 GHz and 40 GHz, respectively.
机译:时序抖动是SFQ电路性能的重要限制。我们关注于约瑟夫森传输线(JTL)中的时序抖动,该抖动在逻辑门处引起时序误差。对2位移位寄存器进行适当的数据分析后,对于以设计偏置电流供电的JTL中的单个Josephson结,其抖动值约为0.08 ps。逻辑单元的时序参数的变化也会引起时序误差。我们通过实验确定了几个逻辑单元中的时序参数,发现实际值和标称值之间的偏差在2 ps之内。通过外推在2位移位寄存器中观察到的跃迁曲线,可以估算出灰色区域与电路规模之间的关系。在20 GHz和40 GHz的工作时钟频率下,估计的电路规模分别为20,000-100,000 JJ和1,000 JJ。

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