Critical Current Degradation Behavior in Lap-Jointed Coated Conductor Tapes With IBAD Substrate Under Uniaxial Tension

摘要

Considering the expansion of application field of coated conductor (CC) tapes, it is preferred to adopt IBAD substrate which has high yield strength to resolve the strength problem. The electro-mechanical characteristics of the CC tapes will be influenced by the superconductor type and the deposition process adopted during manufacturing. In this study, the $I_{c}$ degradation behavior of jointed IBAD processed CC tapes under uniaxial tension has been investigated. The $I_{c}$ degradation behavior of the jointed CC tapes under uniaxial tension has also been compared with those in single tapes. Differently processed YBCO and SmBCO CC tapes with IBAD substrate have been used as samples. The CC tapes jointed by mechanical controlled method were subjected to uniaxial loading. Joint resistances and critical current of lap-jointed specimens have been derived from the $I-V$ curves obtained at each tensile load at 77 K under self-field. In the case of YBCO CC tapes, lap-jointed tape showed a comparable irreversible strain limit with the single tape.