...
机译:Nb $ _ {3} $ Sn Rutherford电缆与MgO带和S玻璃带芯的耦合损耗,链间接触电阻和磁化强度
Laboratories for Applied Superconductivity and Magnetism (LASM), Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA;
${hbox {Nb}}_{3}{hbox {Sn}}$ Rutherford cable; AC loss; MgO-paper tape; calorimetry magnetization; cored cables; interstrand contact resistance; s-glass ribbon;
机译:不锈钢芯对$ hbox {Nb} _ {3} hbox {Sn} $ Rutherford电缆的耦合损耗,链间接触电阻和磁化强度的影响
机译:具有不同材料和宽度的芯的$ {hbox {Nb}} _ {3} {hbox {Sn}} $ Rutherford电缆的线间接触电阻和磁化强度
机译:芯线宽度,位置和条件对量热测量的交流损耗和不锈钢芯$ hbox {Nb} _ {3} hbox {Sn} $ Rutherford电缆的交流损耗的影响
机译:CORED NB3SN RUTHERFORD电缆中AC损耗的测量:INTERSTRAND接触电阻作为核心宽度的功能
机译:Nb3Sn核心Rutherford电缆交流损耗的测量:股间接触电阻与芯线宽度的函数